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About the Journal
JCAT is a peer-reviewed electronic journal designed to advance the science and practice of computerized adaptive testing (CAT). JCAT publishes two types of manuscripts:
- Empirical research reports, theoretical papers, and integrative critical reviews on topics directly related to CAT (e.g., item selection algorithms, security algorithms, multistage designs, examinee reactions to CAT, DIF in CAT, item bank development, the psychometrics of CAT) and on important ancillary topics (e.g., innovative item types, assessment engineering, psychometric models, issues surrounding the technology of adaptive testing, validity studies).
- Applications and implementations of CAT. These articles include descriptions of specific decisions made for a particular purpose, required by the nature of the adaptive test being developed, including (but not limited to) the nature of the testing population, the type of decisions being made with the information from the test, the size of the available item bank, the changing nature of item styles, approaches to field testing, and complex item selection procedures.
JCAT is the official journal of the International Association for Computerized Adaptive Testing.
To submit a manuscript, select the green "Information -- For Authors" link on the bottom right, and follow the instructions.
To subscribe to JCAT, select the "Information -- For Readers" link on the bottom right. Subscriptions are free.
To access articles published in the current year, select CURRENT on the top line of any page. To access articles from previous years, select ARCHIVES.
Dr. Duanli Yan, Director of Data Analysis and Computational Research , Educational Testing Service, U.S.A.
John Barnard, EPEC, Australia
Kirk A. Becker, Pearson VUE, U.S.A.
Theo Eggen, Cito and University of Twente, The Netherlands
Andreas Frey, Goethe University Frankfurt, Germany
and University of Oslo, Norway
Kyung T. Han, Graduate Management Admission Council, U.S.A.
G. Gage Kingsbury, Psychometric Consultant, U.S.A
Alan D. Mead, Illinois Institute of Technology, U.S.A.
Mark D. Reckase, Michigan State University, U.S.A.
Bernard P. Veldkamp, University of Twente, The Netherlands
Chun Wang, University of Washington, U.S.A.
Steven L. Wise, Northwest Evaluation Association, U.S.A.