Uniform Test Assembly: Concepts, Problems, Solvers, and Applications for Adaptive Testing

Authors

  • Dmitry I. Belov Law School Admission Council

DOI:

https://doi.org/10.7333/jcat.v5i1.61

Abstract

This paper presents the latest developments since the publication of the seminal book by van der Linden (2005) on general types of test assembly (TA) problems, major automated test assembly (ATA) methods, and various practical situations in which a TA problem arises. With the power of modern combinatorial optimization (CO) methods, multiple practical tasks in test development and design that were previously intractable can now be solved. The TA problem is, therefore, no longer a central issue for test development but rather a subproblem embedded in different practical tasks, where two major approaches are currently exploited: mixed-integer programming (MIP) and uniform test assembly (UTA). In the world of ATA, the MIP approach is dominant. However, UTA has multiple advantages over MIP. This paper concentrates on UTA and enumerates its multiple applications for adaptive testing.

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Published

2017-02-22

Issue

Vol. 5 No. 1 (2017): Uniform Test Assembly: Concepts, Problems, Solvers, and Applications for Adaptive Testing

Section

Articles

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